Atomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layers

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dc.contributor.authorOyarzún, Diego P.
dc.contributor.authorLinarez Pérez, Omar E.
dc.contributor.authorLópez Teijelo, Manuel
dc.contributor.authorZúñiga, César
dc.contributor.authorJeraldo, Eduardo
dc.contributor.authorGeraldo, Daniela A.
dc.contributor.authorArratia-Perez, Ramiro
dc.date.accessioned2023-09-25T17:49:06Z
dc.date.available2023-09-25T17:49:06Z
dc.date.issued2016-02
dc.descriptionIndexación: Scopuses
dc.description.abstractThe morphologic characterization of self-organized TiO2 nanostructures by field emission scanning electron microscopy (FESEM) and transmission electron microscopy (TEM) was compared with results obtained by both atomic force microscopy (AFM) and 3D confocal microscopy, which were employed as alternative characterization methods. It is demonstrated that AFM with tuning fork configuration (intermittent mode) is also a powerful tool that allows obtaining conclusive information on the morphology of one-dimensional nanostructures. 3D confocal microscopy employed for the first time for obtaining thickness of nanoporous TiO2 films, is a new and powerful method that provides definite information on thickness of the nanostructures. The results employed for the characterization are fairly reliable besides novel and interesting. © 2015 Elsevier B.V.es
dc.description.urihttps://www-sciencedirect-com.recursosbiblioteca.unab.cl/science/article/pii/S0167577X15309095?via%3Dihub
dc.identifier.citationMaterials Letters Volume 165, Pages 67 - 7015 February 2016es
dc.identifier.doi10.1016/j.matlet.2015.11.087
dc.identifier.issn0167-577X
dc.identifier.urihttps://repositorio.unab.cl/xmlui/handle/ria/53303
dc.language.isoenes
dc.publisherElsevieres
dc.rights.licenseAtribución 4.0 Internacional (CC BY 4.0)
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/deed.es
dc.subject3D confocal microscopyes
dc.subjectMaterials characterizationes
dc.subjectThin filmses
dc.subjectTiO2 nanoporouses
dc.subjectTuning fork AFMes
dc.titleAtomic force microscopy (AFM) and 3D confocal microscopy as alternative techniques for the morphological characterization of anodic TiO2 nanoporous layerses
dc.typeArtículoes
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